By combining the cumulative experience of Jobin Yvon in optics with the expertise and almost twenty years experience of SOFIE Instruments in thin film processing and plasma diagnosis, JOBIN YVON has now achieved leadership in the market for in-situ real-time process monitoring equipment.

Pursuing a tradition of innovation, and working in collaboration with major semiconductor manufacturers, research establishments and plasma processing equipment suppliers, JOBIN YVON has developed a wide range of complementary analytical instruments for in-situ real time process monitoring and plasma diagnosis. These utilise techniques such as Optical Emission Spectroscopy (OES), Interferometry, Ellipsometry and Langmuir Probes.

Our systems respond to the needs of research and fabrication engineers in the semiconductor and optical thin film industries for high performance process monitoring sensors. Our products are constantly evolving, driven by the innovations of our engineers working in collaboration with customers. The new ideas developed at JY Thin Films group on sensors and analytical methods are protected by numerous international patents. The competitive edge of our products is based on the originality of the architecture, smart sensor technology, analytical methodology, and unique signal processing.

We provide the highest level of technical support to our customers. Our global service network includes agents in 80 different countries as well as three application laboratories dedicated to your sample analysis. Today, more than 1500 instruments are running world wide in Fabs, R&D labs and also embedded as OEM modules within etching equipment.