VCA 3000 Wafer Contact Angle Systems from Jobin Yvon

Thin Film Links

Introduction

Ellipsometry
Applications
Basic Principles
Ex-Situ UVISEL
In-Situ UVISEL
Optical Set-up
Software

Process Control
DIGISEM
DIGILEM
DIGITWIN
PlasmaScope
MULTISEM
User Guide

Contact Angle

Applications

EPD at Interfaces

EPD at Depths

Thin Film Metrology

Flat Panel Display Film Thickness

Surface Chemistry

Thin Film Process Control

Surface Cleanliness

HMDS Process

Reflectance Difference Spectroscopy (RDS)

Pulsed Plasma Monitoring

Downloads

VCA-3000 (pdf)

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Ellipsometry

Process Control

Contact Angle

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VCA-3000 Wafer Surface Analysis Systems

This product is sold by Jobin Yvon in the UK and Eire only, please click here for other counties

Specially design for use in semiconductor wafer processing quality control. The system provides quick and accurate contact angle/surface energy analysis on wafer surface to evaluate adhesion, cleanliness and coatings.

APPLICATIONS

Coating assessment of the HMDS process

Surface contamination detection

Adhesive and primer preparation

Coating uniformity

Coating quality

FEATURES

High-resolution video camera with magnifying lens with high intensity LED lighting for precise image capture

Automatic operation

High-end PC standard with high-performance video board for advanced image analysis and video capture

Windows; SOFTWARE FEATURES

Automatic contact angle imaging and calculation

Dynamic droplet capture (movie viewing of droplets)

Surface energy (dynes/cm) analysis

SPC (Statistical Process Control)

Pendant Drop surface tension analysis

Data Charting

Wafer mapping Display

Please go to our other Video Contact Angle Systems

General purpose systems

AST Wafer Contact Angle

VCA-3000 Wafer Surface Analysis Systems