|
Ultimate Specifications |
Standard Specifications |
Control |
|
Dimension |
Up to 250
mm length |
|
|
|
Radius
of Curvature |
Down to 0.01% |
0.5% |
Calibrated Samples
LTP Measurements |
|
Slope Error |
Down to 0.1
arcsec rms |
0.2 arcsec rms |
LTP Measurements
Interferometer |
|
Microroughness |
Down to 2
Å rms |
5 Å rms |
Micromap measurements |
|
Substrate |
Silicon
Fused Silica
SiC CVD |
|
|
|
Coating |
Au
Pt
AlMgF
Ni |
Cr binding layer |
Quartz monitoring |
|
Groove Density |
Deviation
less than 0.1 gr/mm |
Moiré
Fringes (JY patent)
|
|
Efficiency |
Groove
depth and duty cycle ratio optimised with JY proprietary software |
|
Groove Depth |
+/- 5% |
+/- 10% |
AFM measurements |
|
c/d Ratio |
+/- 5% |
+/- 10% |
AFM measurements |