|
|
Specifications & Control
|
Ultimate Specifications |
Standard Specifications |
Control |
|
Dimension |
Up to 250
mm length |
|
|
|
Radius
of Curvature |
Superior at
few tens of km |
LTP Measurements |
|
Slope Error |
Down to 0.1
arcsec rms |
0.2 arcsec rms |
LTP Measurements
Interferometer |
|
Microroughness |
Down to 2
Å rms |
5 Å rms |
Micromap measurements |
|
Substrate |
Silicon
Fused Silica
SiC CVD |
|
|
|
Coating |
Au
Pt
AlMgF
Ni |
Cr binding layer |
Quartz monitoring |
|
Groove Density |
Follows a
polynomial law
Recording
layout using JY proprietry software
Optical ray
tracing of the monochromator |
Moiré
Fringes (JY patent)
LTP measurement |
|
Efficiency |
Groove
depth and duty cycle ratio optimised with JY proprietry software |
|
Groove Depth |
+/- 5% |
+/- 10% |
AFM measurements |
|
c/d Ratio |
+/- 5% |
+/- 10% |
AFM measurements |
Examples of Variable Line Space Plane Holographic Gratings
|
Size mm |
Optical
surface mm |
Slope
Error arcsec rms |
Max
Microroughness Å rms |
Coating |
Substrate |
|
200x50x30 |
190x45 |
0.2 arcsec rms |
5 |
Au or Pt |
Silicon
Fused Silica |
|
150x40x25 |
140x35 |
0.2 arcsec rms |
5 |
Au or Pt |
Silicon
Fused Silica |
|
100x30x20 |
90x25 |
0.1 arcsec rms |
5 |
Au or Pt |
Silicon
Fused Silica |
Note: Recording wavefronts
are either two spherical, one spherical and one aspherical or both
aspherical depending on the required polynomial. |