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Raman
and Photoluminescence
Measurements
with
a Single Bench Top System

New from
Jobin Yvon is the Raman PL bench top system. Using a unique
combination of both visible and infrared spectroscopies, it yields
greater depth of information than is possible by just a single range analysis.
This is
particularly useful in the characterisation of semiconductor
materials and can provide information directly related to the
electronic and optical properties of the sample.
Emission
spectra in photoluminescence measurements often extend across the
Near IR, (above 1.1 microns), where conventional Raman instruments
using CCD detectors are usually not sensitive. To achieve Raman and
photoluminescence analysis, Jobin Yvon's LabRam system can now
include two ports for different detectors, a standard Raman CCD
detectors and an InGaAs Array detectors, the latter being ideally
suited to the NIR PL (photoluminescence) range.
The user
has the ability to switch between Raman and PL analysis without any
need for adjustment, The instruments combine the two techniques and
enables both measurements to be made at exactly the same position on
the sample for precise characterisation and analysis.
For further
information, contact
.
Alternatively, click here for
more information on the range of Raman instrumentation.
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