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Come and see Jobin Yvon at Semiconductor 2001 June 12th & 13th Edinburgh International Conference Centre   Jobin Yvon offer a comprehensive range of in-situ real time endpoint detection systems using both optical emission spectroscopy and interferometry for plasma (dry) etch and deposition applications. Additionally, we offer a large range of optical analysis equipment including spectroscopic ellipsometers, Raman spectrometers, photoluminescence systems, contact angle analysers and glow discharge equipment for both quality assurance and quality control applications and for more fundamental material analysis. Jobin Yvon is proud to be a member of the world wide HORIBA group who also have a long history of supplying the semiconductor industry through STEC and HORIBA instruments. Come and see our exhibition at the above show for further information. Alternatively, contact .

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